Registry

Module Specifications

Current Academic Year 2012 - 2013
Please note that this information is subject to change.

Module Title	Characterisation Technology for Nanomaterials
Module Code	EE550
School	School of Electronic Engineering
Online Module Resources
Module Co-ordinator	Semester 1: Patrick McNally Semester 2: Patrick McNally Autumn: Patrick McNally
Module Teacher	Patrick McNally
NFQ level	8	Credit Rating	7.5
Pre-requisite	None
Co-requisite	None
Compatibles	None
Incompatibles	None

Description

Developments in novel semiconductor materials such as superlattice and quantum well systems and the ever-diminishing size of devices are producing an explosion of interest and activity in the field of semiconductor devices. This has brought with it the need to characterise the materials, to determine the crystal quality, their purity and their electrical properties, which information can be fed back to the producer of the materials in an interactive manner to improve current growth techniques and to help in the development of novel technologies. This module is primarily about the science and technology of the production of semiconductors for devices and the ways in which these materials are characterised.

Learning Outcomes

1. Display an advanced graduate-level knowledge the fundamental materials science of nanostructures, with a particular emphasis being placed on semiconductor-based nanomaterials
2. Develop a systematic approach to the future requirements for characterisation technologies.
3. Demonstrate a professional knowledge of three main characterisation methodologies: electrical characterisation, optical characterisation and chemo-physical characterisation
4. Write a professional review of a current nanocharacterisaton technology or scientific problem.

Workload	Full-time hours per semester
*Type*	*Hours*	*Description*
Lecture	36	No Description
Independent learning	152	Including review paper and homework set
Total Workload: 188

All module information is indicative and subject to change. For further information,students are advised to refer to the University's Marks and Standards and Programme Specific Regulations at: http://www.dcu.ie/registry/examinations/index.shtml

Indicative Content and Learning Activities

The structure of semiconductors.
Crystal planes and structures, defects, surfaces and interfaces, reciprocal lattice..

Electrical Characterisation.
Surface resistivity measurements; contact resistance, Schottky barriers; electromigration; temperature dependence of carrier mobilities; Hall effect measurements; geometric magnetoresistance; capacitance-voltage techniques; carrier and doping density; deep-level transient spectroscopy..

Optical Characterisation.
X-ray diffraction in a 3D solid; conventional q-2q x-ray diffraction; x-ray diffraction linewidth, rocking curves and crystal perfection; determination of nanocrystallite sizes and strains; x-ray synchrotrons; x-ray topography. Carrier recombination and photoconductivity; excitons; photoluminescence; ellipsometry; photoacoustic spectroscopy; micro-Raman spectroscopy..

Chemo-physical Characterisation.
Secondary ion mass spectrometry (SIMS), Rutherford backscattering (RBS), Auger electron spectroscopy (AES)..

Assessment Breakdown
Continuous Assessment	40%	Examination Weight	60%

Course Work Breakdown
Type	Description	% of total	Assessment Date
Report (s) (written / oral)	Professional Review Paper	30%	Sem 1 End
Assignment	Homework Problems	10%	Week 10

Reassessment Requirement
Resit arrangements are explained by the following categories; 1 = A resit is available for all components of the module 2 = No resit is available for 100% continuous assessment module 3 = No resit is available for the continuous assessment component
This module is category 3

Indicative Reading List

Dieter K. Schroder: 2006, Semiconductor material and device characterization, 3, Wiley Interscience, 0-471-73906-5
0: Module Web Notes and Lecture Videos, 24136
2005: Introduction to solid state physics, 8, Wiley, Hoboken, N.J.,

Other Resources

None

Array

Programme or List of Programmes

CAPD

PhD

CAPM

MSc

CAPT

PhD-track

ECSAO

Study Abroad (Engineering & Computing)