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Module Specifications

Current Academic Year 2012 - 2013
Please note that this information is subject to change.

Module Title
Module Code
School
Online Module Resources

Module TeacherJim Conway
NFQ level 8 Credit Rating
Pre-requisite None
Co-requisite None
Compatibles None
Incompatibles None
Description
The purpose of this module is to provide participants with a broad introduction to the fundamentals concepts of surface physics. In this module students will develop knowledge and skills relating to surface structures, and an array of surface analysis techniques. The course aims to give students a full and thorough knowledge of these topics with emphasis placed techniques used in industrial applications to monitor material properties after treatment.Students are expected to access all course material online, participate in online discussion groups where they can discuss the course material and set problems relating to the course material, and participate in various learning activities and continuous assessment tasks on a regular basis.

Learning Outcomes
1. Describe surface structure of common crystal configurations.
2. Relate secondary electron spectra to surface chemical composition for both ESCA and Auger electron spectroscopy.
3. Understand the basics principles of SIMS anaylsis of surface composition.
4. Compare electron microscope and AFM surface analysis.
5. Discuss x ray diffraction and electron diffraction techniques in relation to surface structure analysis.
6. Solve applied problems, identifying the key parameters involved and performing relevant numerical calcuations.
7. Communicate the material covered and its applications to their collegues.



Workload Full-time hours per semester
Type Hours Description
Total Workload: 0

All module information is indicative and subject to change. For further information,students are advised to refer to the University's Marks and Standards and Programme Specific Regulations at: http://www.dcu.ie/registry/examinations/index.shtml

Indicative Content and Learning Activities
Indicative syllabus.
Surface structure of crystals. Electron energy analysers. X-ray and Electron sources / monochromators. UV and X-ray Photoelectron Spectroscopy (PES, XPS). Auger Electron Spectroscopy (AES). Secondary ion mass spectroscopy (SIMS). Quantitative analysis by XPS, AES, SIMS. Electron microscope, AFM. Surface Structure: 2 dimensional lattices. Low Energy Electron Diffraction (LEED). Reflection High Energy Electron Diffraction (RHEED). Scanning Tunnelling Microscopy (STM). X-Ray Diffraction..

Assessment Breakdown
Continuous Assessment% Examination Weight%
Course Work Breakdown
TypeDescription% of totalAssessment Date
Computerised test/examOnline quiz based in multichoice, matching, short answers and numerical calculation problems.8%Week 3
EssayAssignment consisting of definition, essay and numerical problems solving.8%Week 4
Computerised test/examOnline quiz based in multichoice, matching, short answers and numerical calculation problems.9%Week 6
EssayAssignment consisting of definition, essay and numerical problems solving.9%Week 6
Oral presentationsOnline discussion forum.16%Every Week
Non-DCU examWritten test involving essay and calcuation type problems based on all course material.50%Week 8
Reassessment Requirement
Resit arrangements are explained by the following categories;
1 = A resit is available for all components of the module
2 = No resit is available for 100% continuous assessment module
3 = No resit is available for the continuous assessment component
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