Electron Microscopy

Hitachi S5500 Field Emission Scanning Electron Microscope

The Hitachi S-5500 Field Emission SEM is an ultra-high-resolution system for imaging materials at the nanoscale, with magnification up to 2,000,000×. It offers both scanning and transmission modes, making it well suited for nanoparticle and thin-film studies. Energy-dispersive X-ray spectroscopy (EDX) is available for elemental analysis, while a cryogenic stage allows imaging of volatile or beam-sensitive samples. This versatility makes the S-5500 a powerful platform for advanced materials characterization.

Specifications:

• High-brightness electron beam with low current and small energy dispersion, providing ultra-high resolution imaging. Beam energy ranges from 0.5 kV to 30 kV.
• Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) capabilities for versatile material analysis.
• 6 available detectors, including Secondary Electron (SE), High-Angle Backscatter (HAB), Low-Angle Backscatter (LAB), EDX (Energy Dispersive X-ray), Transmission Brightfield (TB), and Transmission Darkfield (TD).
• Cryogenic sample stage which operates below −100 °C to preserve volatile or beam-sensitive samples, such as hydrated biological materials, fixed cells, or sol-gels.
• Suitable for Life Sciences, Materials Science, and Semiconductor research, providing high-resolution imaging and elemental analysis.

Featured Publications: 

Cannon, P. et al. (2024) ‘Deposition of high-quality, nanoscale sio2 films and 3D Structures’, Applied Materials Today, 38, p. 102175. doi:10.1016/j.apmt.2024.102175.

Bartkowski, M. et al. (2024) ‘Enhancing pancreatic ductal adenocarcinoma (PDAC) therapy with targeted carbon nano-onion (cno)-mediated delivery of Gemcitabine (gem)-derived prodrugs’, Journal of Colloid and Interface Science, 659, pp. 339–354. doi:10.1016/j.jcis.2023.12.166.

Murphy, A. et al. (2020) ‘Fasciola hepatica extracellular vesicles isolated from excretory-secretory products using a gravity flow method modulate dendritic cell phenotype and activity’, PLOS Neglected Tropical Diseases, 14(9). doi:10.1371/journal.pntd.0008626.

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Jeol JSM‑IT100 InTouchScope SEM

The Jeol JSM‑IT100 InTouchScope SEM is a versatile scanning electron microscope offering high-resolution imaging for a wide range of sample types. It supports both high- and low-vacuum (variable pressure) modes, allowing imaging of non-conductive or hydrated samples without coating. With flexible magnification and adjustable accelerating voltages, the JSM‑IT100 provides clear, detailed imaging for materials science, life science, and nanotechnology applications. Its combination of resolution and adaptability makes it a powerful tool for routine and advanced SEM studies.

Specifications: 

• Thermionic emission SEM with adjustable accelerating voltage from 0.5 kV to 30 kV
• Variable pressure mode
• Magnification up to ×300,000
• 5-axis eucentric stage (X, Y, Z, tilt, rotation) for precise positioning and examination of tilted samples; capable of handling large samples
• Long working distance facilitates observation of tilted or bulky samples
• Standard secondary electron (SE) and backscatter (BSE) detectors
• Ideal for Life Sciences, Materials Science, and Additive Manufacturing research, offering flexibility for a wide range of sample types and imaging conditions

Featured Publications: 

Agarwal, N. et al. (2024) ‘Influence of laser powder bed fusion and ageing heat treatment parameters on the phase structure and physical behavior of ni-rich nitinol parts’, Journal of Materials Research and Technology, 30, pp. 4527–4541. doi:10.1016/j.jmrt.2024.04.198.

Cholkar, A. et al. (2023) ‘Biofouling and corrosion protection of aluminum alloys through ultrafast laser surface texturing for marine applications’, Advanced Materials Interfaces, 11(6). doi:10.1002/admi.202300835.

Brady, Á., Wagner, M. and Forster, R.J. (2024) ‘Regio selective deposition of conducting polymers using wireless electropolymerisation’, Chemical Communications, 60(89), pp. 13000–13003. doi:10.1039/d4cc03996c.

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