Surface Analysis

Bruker Icon AFM

The Bruker Icon is a high-resolution atomic force microscope designed for nanoscale imaging, surface characterization, and mechanical property measurements. It allows researchers to obtain topography, roughness, and nanomechanical data with sub-nanometre precision on a wide variety of materials. Applications include materials science, polymer research, biomaterials, and semiconductor studies, where detailed surface and mechanical analysis at the nanoscale is essential.

Specifications:

• Imaging modes: Contact, tapping, PeakForce QNM, force mapping, and advanced nanomechanical modes
• Resolution: Sub-nanometre vertical and lateral resolution
• Scan range: Typically up to 90 µm × 90 µm (depends on scanner)
• Force sensitivity: Pico- to nanonewton range for mechanical measurements
• Sample types: Polymers, biomaterials, metals, semiconductors, and soft materials
• Applications: Surface topography, roughness analysis, mechanical property mapping, adhesion and elasticity measurements, nanoscale imaging of materials

Featured Publications:

Reid, G. et al. (2024) ‘Insights into the feature size required for the death of pseudomonas fluorescens on nanostructured silicon fabricated by Block Copolymer Lithography’, Materials Today Communications, 38, p. 108386. doi:10.1016/j.mtcomm.2024.108386.

Gibney, A. et al. (2023b) ‘A click chemistry‐based artificial metallo‐nuclease’, Angewandte Chemie International Edition, 62(38). doi:10.1002/anie.202305759.

Cannon, P. et al. (2024) ‘Deposition of high-quality, nanoscale sio2 films and 3D Structures’, Applied Materials Today, 38, p. 102175. doi:10.1016/j.apmt.2024.102175.

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Keyence VHX-X1 Digital Microscope

The Keyence VHX-X1 is a versatile digital microscope designed for high-resolution imaging and advanced 3D analysis. With a wide magnification range and motorized stage control, it enables users to capture clear images of both large samples and fine microstructures. Depth-composition imaging ensures that entire surfaces remain in focus, while 3D reconstruction provides detailed surface profiling and measurement. With the addition of laser-induced breakdown spectroscopy (LIBS), the system also allows for direct elemental analysis of regions of interest, combining structural visualization with chemical information. This integration makes it especially powerful for materials science, metallurgy, electronics, and failure analysis, where both microstructural and compositional insights are required.

Specifications:

• 20× to >6000× magnification range
• 2D, depth composition, and 3D surface reconstruction imaging modes
• Motorized XYZ stage for precise sample positioning and automated scans
• 2D/3D measurements, roughness, height, and volume analysis
• Multiple coaxial, ring, and oblique illumination modes lighting options
• Integrated elemental analysis directly from selected regions using LIBS

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Bruker Dektak XT Stylus Profiler

The Bruker Dektak XT is a high-precision stylus profiler for measuring surface topography, height, and roughness at the nanometer scale. Its stable design and low-noise allow accurate measurements across a wide range making it ideal for studies in materials science, microfabrication, and surface engineering for applications such as Thin Film Inspection, Surface Roughness Verification and Microfluidics design and performance verificaiton.

Specifications:

• Capable of measuring large vertical features up to 1 mm in height
• Excellent mechanical stability and minimal drift
• Suitable for a wide range of materials, including delicate or sensitive surfaces.

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Bruker Contour GT 3D Optical Profiler

The Bruker Contour GT 3D Optical Profiler is a high-precision optical metrology system for 3D surface measurement. It provides nanometer-scale vertical resolution on complex surfaces, with fully automated focus, intensity, and stage control. Its robust design, including an integral vibration-isolation cabinet, and advanced measurement optimization make it suitable for a wide range of research and production applications in materials science, microfabrication, and surface engineering.

Specificaitons:

• Nanometer-scale, capable of measuring high-contour surfaces with precision
• Unique metrology sensor design with patented dual-LED light source
• Self-calibrating, metrology optimizing laser reference
• Integral vibration-isolation floor-mount cabinet
• Fully automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV)
• Nanometer-scale resolution on high-contour surfaces
• Extensive library of filters, customizable analysis options, and real-time automated measurement optimization
• Ideal for research and production workflows in materials science, microfabrication, and precision surface metrology

Featured Publications: 

Obeidi, M.A. et al. (2024) ‘Towards a sustainable laser powder bed fusion process via the characterisation of additively manufactured nitinol parts’, Designs, 8(3), p. 45. doi:10.3390/designs8030045.

Doğu, M.N. et al. (2024) ‘Powder bed fusion–laser beam of IN939: The effect of process parameters on the relative density, defect formation, surface roughness and microstructure’, Materials, 17(13), p. 3324. doi:10.3390/ma17133324.

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Bruker Hysitron TI Premier Nanoindenter

The Bruker Hysitron TI Premier Nanoindenter is an automated nano-mechanical testing system for measuring hardness, elastic modulus, fracture toughness, and other mechanical properties via controlled nanoindentation. Indentations can be imaged using the indenter head or integrated optics. Mounted on a low-vibration platform, the system provides high-precision measurements across a wide range of materials.

Specifications:

• 75 nN to 10 mN load
• 2 nN Force Resolution
• Three-plate capacitive transucer for low noise and high sensitivity
• Measures hardness, elastic modulus, fracture toughness, can evaluates wear resistance at the nanoscale and provides high-resolution imaging using scanning probe microscopy
• Suitable for materials science, microfabrication, polymers, thin films, and nanotechnology research

Featured Publications:

Mussatto, A. et al. (2022a) ‘Assessing dependency of part properties on the printing location in laser-powder bed fusion metal additive manufacturing’, Materials Today Communications, 30, p. 103209. doi:10.1016/j.mtcomm.2022.103209.

Motas, J.G. et al. (2021) ‘XPS, SEM, DSC and nanoindentation characterization of silver nanoparticle-coated biopolymer pellets’, Applied Sciences, 11(16), p. 7706. doi:10.3390/app11167706.

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FTA 200 Dynamic Contact Angle Analyser 

The FTA 200 Dynamic Contact Angle Analyser is a versatile system for measuring contact angle, surface tension, interfacial tension, wettability, and absorption of liquids on a variety of surfaces. It also allows calculation of surface energy as a direct function of contact angle or surface tension. Its flexible video imaging system provides high-precision analysis for coatings, polymers, biomaterials, and other materials where surface interactions are critical, making it ideal for research in materials science, surface engineering, and product development.

Specifications:

• Contact angle (static, equilibrium, advancing, receding, capillary)
• Surface tension via pendant drop and sessile drop methods
• Interfacial tension using pendant drop and drop volume methods
• Spreading and adsorption behavior of sessile drops
• Surface energy calculation from contact angle or surface tension
• Critical micelle concentration (CMC) and critical wetting tension (CWT)
• High-resolution video for precise drop shape analysis
• Software provides automated calculations and analysis of multiple parameters from drop shapes

Featured Publications:

Sahebalzamani, M. et al. (2024) ‘Deposition of multilayer coatings onto highly porous materials by layer-by-layer assembly for bone tissue engineering applications using cyclic mechanical deformation and perfusion’, Materials Advances, 5(6), pp. 2316–2327. doi:10.1039/d3ma00664f.

Cholkar, A. et al. (2024) ‘Parametric investigation of ultrashort pulsed laser surface texturing on aluminium alloy 7075 for hydrophobicity enhancement’, The International Journal of Advanced Manufacturing Technology, 130(9–10), pp. 4169–4186. doi:10.1007/s00170-024-12971-8.

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