Patrick McNally
Prof
Contact Details
S357
T: Ext. 5119
E: Patrick.McNally@dcu.ie
Full Professor of Electronic Engineering
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353862490713
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353862490713
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/
Deputy Director
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353862490713
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353862490713
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/
Principal Investigator
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353861732374
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/
S357
School of Electronic Engineering
Dublin City University
Dublin 9
IRELAND
T: +35317005119
F: +35317005508
M: +353861732374
E: patrick.mcnally@dcu.ie
W: http://www.eeng.dcu.ie/npl/

Biography
Book Chapters
Year | Publication | |
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2012 | 'Raman Spectroscopy and its Application in the Characterization of Semiconductor Devices'
McNally P. (2012) 'Raman Spectroscopy and its Application in the Characterization of Semiconductor Devices' In: Nanomaterials: Processing and Characterization with Lasers. [DOI] [Details] |
Peer Reviewed Journals
Year | Publication | |
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2016 | 'Fabrication and characterisation of GaAs nanopillars using nanosphere lithography and metal assisted chemical etching'
Cowley, A;Steele, JA;Byrne, D;Vijayaraghavan, RK;McNally, PJ (2016) 'Fabrication and characterisation of GaAs nanopillars using nanosphere lithography and metal assisted chemical etching'. RSC Advances, 6 :30468-30473 [DOI] [Details] |
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2016 | 'Reduction of the impact of atmospheric ageing effects on spin coated gamma-CuCl nanocrystalline hybrid films'
Alam, MM;Daniels, S;McNally, PJ (2016) 'Reduction of the impact of atmospheric ageing effects on spin coated gamma-CuCl nanocrystalline hybrid films'. Optical Materials, 51 :5-8 [DOI] [Details] |
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2016 | 'Simultaneous depth-profiling of electrical and elemental properties of ion-implanted arsenic in silicon by combining secondary-ion mass spectrometry with resistivity measurements'
Bennett N.;Wong C.;McNally P. (2016) 'Simultaneous depth-profiling of electrical and elemental properties of ion-implanted arsenic in silicon by combining secondary-ion mass spectrometry with resistivity measurements'. Review of Scientific Instruments, 87 (7) [DOI] [Details] |
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2016 | 'Pulsed-Plasma Physical Vapor Deposition Approach Toward the Facile Synthesis of Multilayer and Monolayer Graphene for Anticoagulation Applications'
Vijayaraghavan, RK;Gaman, C;Jose, B;Mccoy, AP;Cafolla, T;McNally, PJ;Daniels, S (2016) 'Pulsed-Plasma Physical Vapor Deposition Approach Toward the Facile Synthesis of Multilayer and Monolayer Graphene for Anticoagulation Applications'. ACS applied materials & interfaces, 8 :4878-4886 [DOI] [Details] |
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2016 | 'Reduction of the impact of atmospheric ageing effects on spin coated γ-CuCl nanocrystalline hybrid films'
Alam M.;Daniels S.;McNally P. (2016) 'Reduction of the impact of atmospheric ageing effects on spin coated γ-CuCl nanocrystalline hybrid films'. Optical Materials, 51 :5-8 [DOI] [Details] |
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2016 | 'B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages'
Cowley, A;Ivankovic, A;Wong, CS;Bennett, NS;Danilewsky, AN;Gonzalez, M;Cherman, V;Vandevelde, B;De Wolf, I;McNally, PJ (2016) 'B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages'. Microelectronics and Reliability, 59 :108-116 [DOI] [Details] |
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2016 | 'Nondestructive Monitoring of Die Warpage in Encapsulated Chip Packages'
Bose A.;Vijayaraghavan R.;Cowley A.;Cherman V.;Varela Pedreira O.;Tanner B.;Danilewsky A.;De Wolf I.;McNally P. (2016) 'Nondestructive Monitoring of Die Warpage in Encapsulated Chip Packages'. IEEE Transactions on Components, Packaging and Manufacturing Technology, 6 (4):653-662 [DOI] [Details] |
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2016 | 'X-ray asterism and the structure of cracks from indentations in silicon'
Tanner B.;Garagorri J.;Gorostegui-Colinas E.;Elizalde M.;Allen D.;McNally P.;Wittge J.;Ehlers C.;Danilewsky A. (2016) 'X-ray asterism and the structure of cracks from indentations in silicon'. Journal of Applied Crystallography, 49 :250-259 [DOI] [Details] |
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2016 | 'Pulsed-Plasma Physical Vapor Deposition Approach Toward the Facile Synthesis of Multilayer and Monolayer Graphene for Anticoagulation Applications'
Vijayaraghavan R.;Gaman C.;Jose B.;McCoy A.;Cafolla T.;McNally P.;Daniels S. (2016) 'Pulsed-Plasma Physical Vapor Deposition Approach Toward the Facile Synthesis of Multilayer and Monolayer Graphene for Anticoagulation Applications'. ACS applied materials & interfaces, 8 (7):4878-4886 [DOI] [Details] |
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2015 | 'Interaction of SF6 and O2 plasma with porous poly phenyl methyl silsesquioxane low-κ films'
Cherunilam J.;Rajani K.;Byrne C.;Heise A.;McNally P.;Daniels S. (2015) 'Interaction of SF6 and O2 plasma with porous poly phenyl methyl silsesquioxane low-κ films'. Journal of Physics D - Applied Physics, 48 (12) [DOI] [Details] |
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2015 | 'Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging'
Li Z.;Danilewsky A.;Helfen L.;Mikulik P.;Haenschke D.;Wittge J.;Allen D.;McNally P.;Baumbach T. (2015) 'Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging'. Journal of Synchrotron Radiation, 22 :1083-1090 [DOI] [Details] |
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2015 | 'Synchrotron white-beam X-ray topography analysis of the defect structure of HVPE-GaN substrates'
Kirste L.;Danilewsky A.;Sochacki T.;Köhler K.;Zajac M.;Kucharski R.;Bóckowski M.;McNally P. (2015) 'Synchrotron white-beam X-ray topography analysis of the defect structure of HVPE-GaN substrates'. ECS Journal of Solid State Science and Technology, 4 (8):P324-P330 [DOI] [Details] |
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2015 | 'The geometry of catastrophic fracture during high temperature processing of silicon'
Tanner B.;Garagorri J.;Gorostegui-Colinas E.;Elizalde M.;Bytheway R.;McNally P.;Danilewsky A. (2015) 'The geometry of catastrophic fracture during high temperature processing of silicon'. International Journal of Fracture, 195 (1-2):79-85 [DOI] [Details] |
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2015 | 'B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages'
Cowley A.;Ivankovic A.;Wong C.;Bennett N.;Danilewsky A.;Gonzalez M.;Cherman V.;Vandevelde B.;De Wolf I.;McNally P. (2015) 'B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages'. Microelectronics and Reliability, [DOI] [Details] |
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2014 | 'Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs'
Bennett N.;Cherkaoui K.;Wong C.;O'Connor ;Monaghan S.;Hurley P.;Chauhan L.;McNally P. (2014) 'Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs'. Thin Solid Films, 569 (C):104-112 [DOI] [Details] |
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2014 | 'Influence of substrate metal alloy type on the properties of hydroxyapatite coatings deposited using a novel ambient temperature deposition technique'
Barry J.;Cowley A.;McNally P.;Dowling D. (2014) 'Influence of substrate metal alloy type on the properties of hydroxyapatite coatings deposited using a novel ambient temperature deposition technique'. Journal of Biomedical Materials Research - Part A, 102 (3):871-879 [DOI] [Details] |
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2014 | 'Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages'
Wong C.;Bennett N.;Manessis D.;Danilewsky A.;McNally P. (2014) 'Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages'. Microelectronic Engineering, 117 :48-56 [DOI] [Details] |
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2014 | 'Temperature dependent photoluminescence of nanocrystalline γ-CuCl hybrid films'
Alam M.;Olabanji Lucas F.;Danieluk D.;Bradley A.;Daniels S.;McNally P. (2014) 'Temperature dependent photoluminescence of nanocrystalline γ-CuCl hybrid films'. Thin Solid Films, 564 :104-109 [DOI] [Details] |
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2014 | 'Influence of oxygen plasma on the growth, structure, morphology, and electro-optical properties of p-type transparent conducting CuBr thin films'
Vijayaraghavan R.;McCoy A.;Chauhan L.;Cowley A.;Morris R.;Daniels S.;McNally P. (2014) 'Influence of oxygen plasma on the growth, structure, morphology, and electro-optical properties of p-type transparent conducting CuBr thin films'. Journal of Physical Chemistry C, 118 (40):23226-23232 [DOI] [Details] |
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2013 | 'Deposition of earth-abundant p-type CuBr films with high hole conductivity and realization of p-CuBr/n-Si heterojunction solar cell'
Rajani K.;Daniels S.;Rahman M.;Cowley A.;McNally P. (2013) 'Deposition of earth-abundant p-type CuBr films with high hole conductivity and realization of p-CuBr/n-Si heterojunction solar cell'. Materials Letters, 111 :63-66 [DOI] [Details] |
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2013 | 'Dellafossite CuAlO2 film growth and conversion to Cu-Al2O3 metal ceramic composite via control of annealing atmospheres'
Byrne, D;Cowley, A;McNally, P;McGlynn, E (2013) 'Dellafossite CuAlO2 film growth and conversion to Cu-Al2O3 metal ceramic composite via control of annealing atmospheres'. CrystEngComm, 15 :6144-6150 [DOI] [Details] |
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2013 | 'Crack propagation and fracture in silicon wafers under thermal stress'
Danilewsky A.;Wittge J.;Kiefl K.;Allen D.;McNally P.;Garagorri J.;Elizalde M.;Baumbach T.;Tanner B. (2013) 'Crack propagation and fracture in silicon wafers under thermal stress'. Journal of Applied Crystallography, 46 (4):849-855 [DOI] [Details] |
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2013 | 'Evaluation and comparison of hydroxyapatite coatings deposited using both thermal and non-thermal techniques'
Barry J.;Twomey B.;Cowley A.;O'Neill L.;McNally P.;Dowling D. (2013) 'Evaluation and comparison of hydroxyapatite coatings deposited using both thermal and non-thermal techniques'. Surface and Coatings Technology, 226 :82-91 [DOI] [Details] |
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2013 | 'Laser machined macro and micro structures on glass for enhanced light trapping in solar cells'
Moore D.;Rahman M.;Dowling D.;McNally P.;Brabazon D. (2013) 'Laser machined macro and micro structures on glass for enhanced light trapping in solar cells'. Applied Physics A: Materials Science and Processing, 110 (3):661-665 [DOI] [Details] |
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2013 | 'Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering'
Rajani K.;Daniels S.;McNally P.;Krishnamurthy S. (2013) 'Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering'. Journal of Physics Condensed Matter, 25 (28) [DOI] [Details] |
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2012 | 'Low temperature growth technique for nanocrystalline cuprous oxide thin films using microwave plasma oxidation of copper'
Rajani K.;Daniels S.;McGlynn E.;Gandhiraman R.;Groarke R.;McNally P. (2012) 'Low temperature growth technique for nanocrystalline cuprous oxide thin films using microwave plasma oxidation of copper'. Materials Letters, 71 :160-163 [DOI] [Details] |
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2012 | 'Study of exciton-polariton modes in nanocrystalline thin films of CuCl using reflectance spectroscopy'
Foy B.;McGlynn E.;Cowley A.;McNally P.;Henry M. (2012) 'Study of exciton-polariton modes in nanocrystalline thin films of CuCl using reflectance spectroscopy'. Journal of Applied Physics, 112 (3) [DOI] [Details] |
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2012 | 'Citrate-capped gold nanoparticle electrophoretic heat production in response to a time-varying radio-frequency electric field'
Corr S.;Raoof M.;MacKeyev Y.;Phounsavath S.;Cheney M.;Cisneros B.;Shur M.;Gozin M.;McNally P.;Wilson L.;Curley S. (2012) 'Citrate-capped gold nanoparticle electrophoretic heat production in response to a time-varying radio-frequency electric field'. Journal of Physical Chemistry C, 116 (45):24380-24389 [DOI] [Details] |
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2012 | 'Structural investigation of MOVPE-grown GaAs on Ge by x-ray techniques'
Wong C.;Bennett N.;Galiana B.;Tejedor P.;Benedicto M.;Molina-Aldareguia J.;McNally P. (2012) 'Structural investigation of MOVPE-grown GaAs on Ge by x-ray techniques'. Semiconductor Science and Technology, 27 (11) [DOI] [Details] |
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2012 | 'Citrate-Capped Gold Nanoparticle Electrophoretic Heat Production in Response to a Time-Varying Radio-Frequency Electric Field'
Corr, SJ;Raoof, M;Mackeyev, Y;Phounsavath, S;Cheney, MA;Cisneros, BT;Shur, M;Gozin, M;McNally, PJ;Wilson, LJ;Curley, SA (2012) 'Citrate-Capped Gold Nanoparticle Electrophoretic Heat Production in Response to a Time-Varying Radio-Frequency Electric Field'. Journal of Physical Chemistry C, 116 :24380-24389 [DOI] [Details] |
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2012 | 'Prediction of the propagation probability of individual cracks in brittle single crystal materials'
Tanner B.;Fossati M.;Garagorri J.;Elizalde M.;Allen D.;McNally P.;Jacques D.;Wittge J.;Danilewsky A. (2012) 'Prediction of the propagation probability of individual cracks in brittle single crystal materials'. Applied Physics Letters, 101 (4) [DOI] [Details] |
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2011 | 'Growth of n-type γ-CuCl with improved carrier concentration by pulsed DC sputtering: Structural, electronic and UV emission properties'
Rajani K.;Olabanji Lucas F.;Daniels S.;Danieluk D.;Bradley A.;Cowley A.;Alam M.;McNally P. (2011) 'Growth of n-type γ-CuCl with improved carrier concentration by pulsed DC sputtering: Structural, electronic and UV emission properties'. Thin Solid Films, 519 (18):6064-6068 [DOI] [Details] |
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2011 | 'CuBr blue light emitting electroluminescent thin film devices'
Lucas F.;Cowley A.;Daniels S.;Mcnally P. (2011) 'CuBr blue light emitting electroluminescent thin film devices'. Physica Status Solidi (C) Current Topics in Solid State Physics, 8 (9):2919-2922 [DOI] [Details] |
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2011 | 'Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon'
Allen D.;Wittge J.;Stopford J.;Danilewsky A.;McNally P. (2011) 'Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon'. Journal of Applied Crystallography, 44 (3):526-531 [DOI] [Details] |
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2011 | 'Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments'
Danilewsky A.;Wittge J.;Hess A.;Cröll A.;Rack A.;Allen D.;McNally P.;Dos Santos Rolo T.;Vagovič P.;Baumbach T.;Garagorri J.;Elizalde M.;Tanner B. (2011) 'Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments'. Physica Status Solidi (A) Applications and Materials, 208 (11):2499-2504 [DOI] [Details] |
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2011 | 'Evaluation of conduction mechanism and electronic parameters for Au/organic-inorganic CuCl hybrid film/ITO structures'
Alam M.;Cowley A.;Rajani K.;Daniels S.;McNally P. (2011) 'Evaluation of conduction mechanism and electronic parameters for Au/organic-inorganic CuCl hybrid film/ITO structures'. Semiconductor Science and Technology, 26 (9) [DOI] [Details] |
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2011 | 'Characteristics of silicon nanocrystals for photovoltaic applications'
Moore D.;Krishnamurthy S.;Chao Y.;Wang Q.;Brabazon D.;McNally P. (2011) 'Characteristics of silicon nanocrystals for photovoltaic applications'. Physica Status Solidi (A) Applications and Materials, 208 (3):604-607 [DOI] [Details] |
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2011 | 'Combined use of three-dimensional X-ray diffraction imaging and micro-Raman spectroscopy for the non-destructive evaluation of plasma arc induced damage on silicon wafers'
Stopford J.;Allen D.;Aldrian O.;Morshed M.;Wittge J.;Danilewsky A.;McNally P. (2011) 'Combined use of three-dimensional X-ray diffraction imaging and micro-Raman spectroscopy for the non-destructive evaluation of plasma arc induced damage on silicon wafers'. Microelectronic Engineering, 88 (1):64-71 [DOI] [Details] |
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2011 | 'Thermal slip sources at the extremity and bevel edge of silicon wafers'
Tanner B.;Wittge J.;Allen D.;Fossati M.;Danilwesky A.;McNally P.;Garagorri J.;Elizalde M.;Jacques D. (2011) 'Thermal slip sources at the extremity and bevel edge of silicon wafers'. Journal of Applied Crystallography, 44 (3):489-494 [DOI] [Details] |
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2011 | 'Poly(vinylpyrrolidone)-stabilized silver nanoparticles for strained-silicon surface enhanced Raman spectroscopy'
Corr S.;O'Reilly L.;Dillon E.;Barron A.;McNally P. (2011) 'Poly(vinylpyrrolidone)-stabilized silver nanoparticles for strained-silicon surface enhanced Raman spectroscopy'. Journal of Raman Spectroscopy, 42 (12):2085-2088 [DOI] [Details] |
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2011 | 'Comprehensive investigation of Ge-Si bonded interfaces using oxygen radical activation'
Byun K.;Fleming P.;Bennett N.;Gity F.;McNally P.;Morris M.;Ferain I.;Colinge C. (2011) 'Comprehensive investigation of Ge-Si bonded interfaces using oxygen radical activation'. Journal of Applied Physics, 109 (12) [DOI] [Details] |
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2010 | 'Characterization of the carrot defect in 4H-SiC epitaxial layers'
Hassan J.;Henry A.;McNally P.;Bergman J. (2010) 'Characterization of the carrot defect in 4H-SiC epitaxial layers'. Journal of Crystal Growth, 312 (11):1828-1837 [DOI] [Details] |
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2010 | 'X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers'
Wittge J.;Danilewsky A.;Allen D.;McNally P.;Li Z.;Baumbach T.;Gorostegui-Colinas E.;Garagorri J.;Elizalde M.;Jacques D.;Fossati M.;Bowen D.;Tanner B. (2010) 'X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers'. Powder Diffraction, 25 (2):99-103 [DOI] [Details] |
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2010 | 'Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography'
Danilewsky A.;Wittge J.;Hess A.;Cröll A.;Allen D.;McNally P.;Vagovič P.;Cecilia A.;Li Z.;Baumbach T.;Gorostegui-Colinas E.;Elizalde M. (2010) 'Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography'. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 268 (3-4):399-402 [DOI] [Details] |
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2010 | 'Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon'
Cowley A.;Lucas F.;Gudimenko E.;Alam M.;Danieluk D.;Bradley A.;McNally P. (2010) 'Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon'. Journal of Physics D - Applied Physics, 43 (16) [DOI] [Details] |
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2010 | 'Ultrathin chromium transparent metal contacts by pulsed dc magnetron sputtering'
Rajani K.;Daniels S.;McNally P.;Lucas F.;Alam M. (2010) 'Ultrathin chromium transparent metal contacts by pulsed dc magnetron sputtering'. Physica Status Solidi (A) Applications and Materials, 207 (7):1586-1589 [DOI] [Details] |
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2010 | 'Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography'
Allen D.;Wittge J.;Zlotos A.;Gorostegui-Colinas E.;Garagorri J.;McNally P.;Danilewsky A.;Elizalde M. (2010) 'Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography'. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 268 (3-4):383-387 [DOI] [Details] |
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2010 | 'Dislocation sources and slip band nucleation from indents on silicon wafers'
Wittge J.;Danilewsky A.;Allen D.;McNally P.;Li Z.;Baumbach T.;Gorostegui-Colinas E.;Garagorri J.;Elizalde M.;Jacques D.;Fossati M.;Bowen D.;Tanner B. (2010) 'Dislocation sources and slip band nucleation from indents on silicon wafers'. Journal of Applied Crystallography, 43 (5 PART 1):1036-1039 [DOI] [Details] |
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2009 | 'Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge'
Lankinen, A;Knuuttila, L;Kostamo, P;Tuomi, TO;Lipsanen, H;McNally, PJ;O'Reilly, L (2009) 'Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge'. Journal of Crystal Growth, 311 :4619-4627 [DOI] [Details] |
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2009 | 'Hybrid organic-inorganic spin-on-glass CuCl films for optoelectronic applications'
Alam, MM;Lucas, FO;Danieluk, D;Bradley, AL;Rajani, KV;Daniels, S;McNally, PJ (2009) 'Hybrid organic-inorganic spin-on-glass CuCl films for optoelectronic applications'. Journal of Physics D - Applied Physics, 42 [DOI] [Details] |
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2009 | 'UV emission on a Si substrate: Optical and structural properties of γ-CuCl on Si grown using liquid phase epitaxy techniques'
Cowley A.;Foy B.;Danilieuk D.;McNally P.;Bradley A.;McGlynn E.;Danilewsky A. (2009) 'UV emission on a Si substrate: Optical and structural properties of γ-CuCl on Si grown using liquid phase epitaxy techniques'. Physica Status Solidi (A) Applications and Materials, 206 (5):923-926 [DOI] [Details] |
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2009 | 'Dislocations and dislocation reduction in space grown GaSb'
Danilewsky, AN;Croll, A;Tonn, J;Schweizer, M;Lauer, S;Benz, KW;Tuomi, T;Rantamaki, R;McNally, P;Curley, J (2009) 'Dislocations and dislocation reduction in space grown GaSb'. Crystal Research and Technology, 44 :1109-1114 [DOI] [Details] |
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2009 | 'Structural, optical and electrical properties of Co-evaporated CuCl/KCl films'
Lucas F.;McNally P.;Cowley A.;Daniels S.;Bradley L.;Danieluk D.;Taylor D. (2009) 'Structural, optical and electrical properties of Co-evaporated CuCl/KCl films'. Physica Status Solidi (C) Current Topics in Solid State Physics, 6 (SUPPL. 1):S114-S118 [DOI] [Details] |
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2008 | 'White beam topography of 300 mm Si wafers'
Danilewsky A.;Wittge J.;Rack A.;Weitkamp T.;Simon R.;Baumbach T.;McNally P. (2008) 'White beam topography of 300 mm Si wafers'. Journal of Materials Science: Materials in Electronics, 19 (SUPPL. 1):S269-S272 [DOI] [Details] |
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2008 | 'Optical properties of CuCl films on silicon substrates'
Mitra, A;O'Reilly, L;Lucas, OF;Natarajan, G;Danieluk, D;Bradley, AL;McNally, PJ;Daniels, S;Cameron, DC;Reader, A;Martinz-Rosas, M (2008) 'Optical properties of CuCl films on silicon substrates'. Physica Status Solidi (B): Basic Research, 245 :2808-2814 [DOI] [Details] |
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2008 | 'Temperature dependent optical properties of UV emitting γ-CuCl thin films'
Natarajan G.;Mitra A.;Daniels S.;Cameron D.;McNally P. (2008) 'Temperature dependent optical properties of UV emitting γ-CuCl thin films'. Thin Solid Films, 516 (7):1439-1442 [DOI] [Details] |
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2008 | 'Influence of target to substrate distance on the sputtered CuCl film properties'
Natarajan G.;Daniels S.;Cameron D.;McNally P. (2008) 'Influence of target to substrate distance on the sputtered CuCl film properties'. Thin Solid Films, 516 (16):5531-5535 [DOI] [Details] |
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2008 | 'Constraints on micro-Raman strain metrology for highly doped strained Si materials'
O'Reilly, L;Horan, K;McNally, PJ;Bennett, NS;Cowern, NEB;Lankinen, A;Sealy, BJ;Gwilliam, RM;Noakes, TCQ;Bailey, P (2008) 'Constraints on micro-Raman strain metrology for highly doped strained Si materials'. Applied Physics Letters, 92 [DOI] [Details] |
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2008 | 'X-ray excited optical luminescence of Mg-doped GaN'
Lankinen, A;Svensk, O;Mattila, M;Tuomi, TO;Lipsanen, H;McNally, PJ;O'Reilly, L;Paulmann, C (2008) 'X-ray excited optical luminescence of Mg-doped GaN'. Journal of X-Ray Science and Technology, 16 :215-220 [Details] |
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2008 | 'Growth and characterisation of epitaxially ordered zinc aluminate domains on c-sapphire'
Grabowska, J;Kumar, RTR;McGlynn, E;Nanda, KK;Newcomb, SB;McNally, PJ;O'Reilly, L;Mosnier, JP;Henry, MO (2008) 'Growth and characterisation of epitaxially ordered zinc aluminate domains on c-sapphire'. Thin Solid Films, 516 :1725-1735 [DOI] [Details] |
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2008 | 'Raman scattering studies of ultrashallow Sb implants in strained Si'
O'Reilly, L;Bennett, NS;McNally, PJ;Sealy, BJ;Cowern, NEB;Lankinen, A;Tuomi, TO (2008) 'Raman scattering studies of ultrashallow Sb implants in strained Si'. Journal of Materials Science: Materials in Electronics, 19 :305-309 [DOI] [Details] |
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2008 | 'Antimony for n -type metal oxide semiconductor ultrashallow junctions in strained Si: A superior dopant to arsenic?'
Bennett N.;Smith A.;Gwilliam R.;Webb R.;Sealy B.;Cowern N.;O'Reilly L.;McNally P. (2008) 'Antimony for n -type metal oxide semiconductor ultrashallow junctions in strained Si: A superior dopant to arsenic?'. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 26 (1):391-395 [DOI] [Details] |
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2007 | 'Preparation and temperature cycling reliability of electroless Ni(P) under bump metallization'
Chen, WM;McCloskey, P;Rohan, JF;Byrne, P;McNally, PJ (2007) 'Preparation and temperature cycling reliability of electroless Ni(P) under bump metallization'. IEEE Transactions on Components and Packaging Technologies, 30 :144-151 [DOI] [Details] |
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2007 | 'Femtosecond versus nanosecond laser micro-machining of InP: a nondestructive three-dimensional analysis of strain'
Xu, L;Lowney, D;McNally, PJ;Borowiec, A;Lankinen, A;Tuomi, TO;Danilewsky, AN (2007) 'Femtosecond versus nanosecond laser micro-machining of InP: a nondestructive three-dimensional analysis of strain'. Semiconductor Science and Technology, 22 :970-979 [DOI] [Details] |
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2007 | 'Evaluation of the chemical, electronic and optoelectronic properties of gamma-CuCl thin films and their fabrication on Si substrates'
Lucas, FO;Mitra, A;McNally, PJ;Daniels, S;Bradley, AL;Taylor, DM;Proskuryakov, YY;Durose, K;Cameron, DC (2007) 'Evaluation of the chemical, electronic and optoelectronic properties of gamma-CuCl thin films and their fabrication on Si substrates'. Journal of Physics D - Applied Physics, 40 :3461-3467 [DOI] [Details] |
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2007 | 'Self-organized ZnAl2O4 nanostructures grown on c-sapphire'
Grabowska J.;Nanda K.;Rajendra Kumar R.;Mosnier J.;Henry M.;Newcomb S.;McNally P.;O'Reilly L.;Lu X.;McGlynn E. (2007) 'Self-organized ZnAl2O4 nanostructures grown on c-sapphire'. Superlattices and Microstructures, 42 (1-6):327-332 [DOI] [Details] |
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2007 | 'Evaluation of the chemical, electronic and optoelectronic properties of γ-CuCl thin films and their fabrication on Si substrates'
Lucas F.;Mitra A.;McNally P.;Daniels S.;Bradley A.;Taylor D.;Proskuryakov Y.;Durose K.;Cameron D. (2007) 'Evaluation of the chemical, electronic and optoelectronic properties of γ-CuCl thin films and their fabrication on Si substrates'. Journal of Physics D - Applied Physics, 40 (11):3461-3467 [DOI] [Details] |
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2006 | 'The evaluation of mechanical stresses developed in underlying silicon substrates due to electroless nickel under bump metallization using synchrotron X-ray topography'
Noonana, D;McNally, PJ;Chen, WM;Lankinen, A;Knuuttila, L;Tuomi, TO;Danilewsky, AN;Simon, R (2006) 'The evaluation of mechanical stresses developed in underlying silicon substrates due to electroless nickel under bump metallization using synchrotron X-ray topography'. Microelectronics, 37 :1372-1378 [DOI] [Details] |
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2006 | 'Highly conductive Sb-doped layers in strained Si'
Bennett, NS;Cowern, NEB;Smith, AJ;Gwilliam, RM;Sealy, BJ;O'Reilly, L;McNally, PJ;Cooke, G;Kheyrandish, H (2006) 'Highly conductive Sb-doped layers in strained Si'. Applied Physics Letters, 89 [DOI] [Details] |
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2006 | 'Stoichiometry control of sputtered CuCl thin films: Influence on ultraviolet emission properties'
Natarajan, G;Kumar, RTR;Daniels, S;Cameron, DC;McNally, PJ (2006) 'Stoichiometry control of sputtered CuCl thin films: Influence on ultraviolet emission properties'. Journal of Applied Physics, 100 [DOI] [Details] |
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2006 | 'Crystal defects and strain of epitaxial InP layers laterally overgrown on Si'
Lankinen, A;Tuomi, T;Karilahti, M;Zytkiewicz, ZR;Domagala, JZ;McNally, PJ;Sun, YT;Olsson, F;Lourdudoss, S (2006) 'Crystal defects and strain of epitaxial InP layers laterally overgrown on Si'. Crystal Growth and Design, 6 :1096-1100 [DOI] [Details] |
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2006 | 'Growth of CuCl thin films by magnetron sputtering for ultraviolet optoelectronic applications'
Natarajan, G;Daniels, S;Cameron, DC;O'Reilly, L;Mitra, A;McNally, PJ;Lucas, OF;Kumar, RTR;Reid, I;Bradley, AL (2006) 'Growth of CuCl thin films by magnetron sputtering for ultraviolet optoelectronic applications'. Journal of Applied Physics, 100 [DOI] [Details] |
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2005 | 'Room-temperature ultraviolet luminescence from gamma-CuCl grown on near lattice-matched silicon'
O'Reilly, L;Lucas, OF;McNally, PJ;Reader, A;Natarajan, G;Daniels, S;Cameron, DC;Mitra, A;Martinez-Rosas, M;Bradley, AL (2005) 'Room-temperature ultraviolet luminescence from gamma-CuCl grown on near lattice-matched silicon'. Journal of Applied Physics, 98 [DOI] [Details] |
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2005 | 'Low temperature growth GaAs on Ge'
Knuuttila, L;Lankinen, A;Likonen, J;Lipsanen, H;Lu, X;McNally, P;Riikonen, J;Tuomi, T (2005) 'Low temperature growth GaAs on Ge'. Japanese Journal of Applied Physics, 44 :7777-7784 [DOI] [Details] |
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2005 | 'Synchrotron X-ray topographic study of dislocations and stacking faults in InAs'
Lankinen, A;Tuomi, T;Riikonen, J;Knuuttila, L;Lipsanen, H;Sopanen, M;Danilewsky, A;McNally, PJ;O'Reilly, L;Zhilyaev, Y;Fedorov, L;Sipila, H;Vaijarvi, S;Simon, R;Lumb, D;Owens, A (2005) 'Synchrotron X-ray topographic study of dislocations and stacking faults in InAs'. Journal of Crystal Growth, 283 :320-327 [DOI] [Details] |
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2005 | 'Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy'
Ryan, BJ;Lowney, DP;Henry, MO;McNally, PJ;McGlynn, E;Jacobs, K;Considine, L (2005) 'Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy'. Thin Solid Films, 473 :308-314 [DOI] [Details] |
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2004 | 'Geometric linewidth and the impact of thermal processing on the stress regimes induced by electroless copper metallization for Si integrated circuit interconnect technology'
McNally, PJ;Kanatharana, J;Toh, BHW;McNeill, DW;Danilewsky, AN;Tuomi, T;Knuuttila, L;Riikonen, J;Toivonen, J;Simon, R (2004) 'Geometric linewidth and the impact of thermal processing on the stress regimes induced by electroless copper metallization for Si integrated circuit interconnect technology'. Journal of Applied Physics, 96 :7596-7602 [DOI] [Details] |
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2004 | 'Comparison of induced stresses due to electroless versus sputtered copper interconnect technology'
McNally, PJ;Kanatharana, J;Toh, BHW;McNeill, DW;Tuomi, T;Danilewsky, AN;Knuuttila, L;Riikonen, J;Toivonen, J (2004) 'Comparison of induced stresses due to electroless versus sputtered copper interconnect technology'. Semiconductor Science and Technology, 19 :1280-1284 [DOI] [Details] |
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2003 | 'Evaluation of mechanical stresses in silicon substrates due to lead-tin solder bumps via synchrotron X-ray topography and finite element modeling'
Kanatharana, J;Perez-Camacho, JJ;Buckley, T;McNally, PJ;Tuomi, T;Danilewsky, AN;O'Hare, M;Lowney, D;Chen, W;Rantamaki, R;Knuuttila, L;Riikonen, J (2003) 'Evaluation of mechanical stresses in silicon substrates due to lead-tin solder bumps via synchrotron X-ray topography and finite element modeling'. Microelectronic Engineering, 65 :209-221 [Details] |
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2003 | 'Integrated circuit process control monitoring (PCM) data and wafer yield analysed by using synchrotron x-ray topographic measurements'
Karilahti, M;Tuomi, T;McNally, PJ (2003) 'Integrated circuit process control monitoring (PCM) data and wafer yield analysed by using synchrotron x-ray topographic measurements'. Semiconductor Science and Technology, 18 :45-55 [Details] |
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2003 | 'Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography'
Chen, WM;McNally, PJ;Shvyd'ko, YV;Tuomi, T;Danilewsky, AN;Lerche, M (2003) 'Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography'. Journal of Crystal Growth, 252 :113-119 [DOI] [Details] |
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2003 | 'Determination of SF6 reactive ion etching end point of the SiO2/Si system by plasma impedance monitoring'
Dewan, MNA;McNally, PJ;Perova, T;Herbert, PAF (2003) 'Determination of SF6 reactive ion etching end point of the SiO2/Si system by plasma impedance monitoring'. Microelectronic Engineering, 65 :25-46 [Details] |
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2002 | 'Plasma modeling for a nonsymmetric capacitive discharge driven by a nonsinusoidal radio frequency current'
Dewan, MNA;McNally, PJ;Herbert, PAF (2002) 'Plasma modeling for a nonsymmetric capacitive discharge driven by a nonsinusoidal radio frequency current'. Journal of Applied Physics, 91 :5604-5613 [DOI] [Details] |
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2002 | 'Examination of mechanical stresses in silicon substrates due to lead-tin solder bumps via micro-Raman spectroscopy and finite element modelling'
Kanatharana, J;Perez-Camacho, JJ;Buckley, T;McNally, PJ;Tuomi, T;Riikonen, J;Danilewsky, AN;O'Hare, M;Lowney, D;Chen, W;Rantamaki, R;Knuuttila, L (2002) 'Examination of mechanical stresses in silicon substrates due to lead-tin solder bumps via micro-Raman spectroscopy and finite element modelling'. Semiconductor Science and Technology, 17 :1255-1260 [Details] |
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2002 | 'Investigation of strain induced effects in silicon wafers due to proximity rapid thermal processing using micro-Raman spectroscopy and synchrotron x-ray topography'
Lowney, D;Perova, TS;Nolan, M;McNally, PJ;Moore, RA;Gamble, HS;Tuomi, T;Rantamaki, R;Danilewsky, AN (2002) 'Investigation of strain induced effects in silicon wafers due to proximity rapid thermal processing using micro-Raman spectroscopy and synchrotron x-ray topography'. Semiconductor Science and Technology, 17 :1081-1089 [Details] |
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2002 | 'Performances of novel Pd/Sn and Pd/Sn/Au ohmic metallizations to n-GaAs'
Islam, MS;Huda, MQ;Alam, AHMZ;McNally, PJ (2002) 'Performances of novel Pd/Sn and Pd/Sn/Au ohmic metallizations to n-GaAs'. Microelectronic Engineering, 60 :457-467 [Details] |
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2002 | 'Determination of crystal misorientation in epitaxial lateral overgrowth of GaN'
Chen, WM;McNally, PJ;Jacobs, K;Tuomi, T;Danilewsky, AN;Zytkiewicz, ZR;Lowney, D;Kanatharana, J;Knuuttila, L;Riikonen, J (2002) 'Determination of crystal misorientation in epitaxial lateral overgrowth of GaN'. Journal of Crystal Growth, 243 :94-102 [Details] |
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2001 | 'Compact DC model for submicron GaAs MESFETs including gate-source modulation effects'
McNally, PJ;Daniels, B (2001) 'Compact DC model for submicron GaAs MESFETs including gate-source modulation effects'. Microelectronics, 32 :249-251 [Details] |
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2001 | 'Use of plasma impedance monitoring for the determination of SF6 reactive ion etch process end points in a SiO2/Si system'
Dewan, MNA;McNally, PJ;Perova, T;Herbert, PAF (2001) 'Use of plasma impedance monitoring for the determination of SF6 reactive ion etch process end points in a SiO2/Si system'. Materials Research Innovations, 5 :107-116 [Details] |
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2001 | 'Epitaxial lateral overgrowth of GaN on sapphire - An examination of epitaxy quality using synchrotron X-ray topography'
McNally, PJ;Tuomi, T;Lowney, D;Jacobs, K;Danilewsky, AN;Rantamaki, R;O'Hare, M;Considine, L (2001) 'Epitaxial lateral overgrowth of GaN on sapphire - An examination of epitaxy quality using synchrotron X-ray topography'. Physica Status Solidi (A) Applied Research, 185 :373-382 [Details] |
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2001 | 'Novel nonalloyed thermally stable Pd/Sn and Pd/Sn/Au Ohmic contacts for the fabrication of GaAs MESFETs'
Islam, MS;McNally, PJ (2001) 'Novel nonalloyed thermally stable Pd/Sn and Pd/Sn/Au Ohmic contacts for the fabrication of GaAs MESFETs'. IEEE Transactions on Electron Devices, 48 :823-825 [Details] |
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2001 | 'Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam x-ray topography'
McNally, PJ;Rantamaki, R;Tuomi, T;Danilewsky, AN;Lowney, D;Curley, JW;Herbert, PAF (2001) 'Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam x-ray topography'. IEEE Transactions on Components and Packaging Technologies, 24 :76-83 [Details] |
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2001 | 'Quality assessment of sapphire wafers for X-ray crystal optics using white beam Synchrotron X-Ray Topography'
Chen, WM;McNally, PJ;Shvydko, YV;Tuomi, T;Lerche, M;Danilewsky, AN;Kanatharana, J;Lowney, D;O'Hare, M;Knuuttila, L;Riikonen, J;Rantamaki, R (2001) 'Quality assessment of sapphire wafers for X-ray crystal optics using white beam Synchrotron X-Ray Topography'. Physica Status Solidi (A) Applied Research, 186 :365-371 [Details] |
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2000 | 'On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure'
McNally, PJ;Dilliway, G;Bonar, JM;Willoughby, A;Tuomi, T;Rantamaki, R;Danilewsky, AN;Lowney, D (2000) 'On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure'. Applied Physics Letters, 77 :1644-1646 [Details] |
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2000 | 'Non-alloyed Pd/Sn and Pd/Sn/Au Ohmic contacts for GaAs MESFETs: Technology and performance'
Islam, MS;McNally, PJ;Alam, AHMZ;Huda, MQ (2000) 'Non-alloyed Pd/Sn and Pd/Sn/Au Ohmic contacts for GaAs MESFETs: Technology and performance'. Solid-State Electronics, 44 :655-661 [Details] |
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2000 | 'Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography'
McNally, PJ;Dilliway, G;Bonar, JM;Willoughby, A;Tuomi, T;Rantamaki, R;Danilewsky, AN;Lowney, D (2000) 'Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography'. Physica Status Solidi (A) Applied Research, 180 :1-3 [Details] |
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1999 | 'The quality of 200 mm diameter epitaxial Si wafers for advanced CMOS technology monitored using synchrotron X-ray topography'
McNally, PJ;Danilewsky, AN;Curley, JW;Reader, A;Rantamaki, R;Tuomi, T;Bolt, M;Taskinen, M (1999) 'The quality of 200 mm diameter epitaxial Si wafers for advanced CMOS technology monitored using synchrotron X-ray topography'. Microelectronic Engineering, 45 :47-56 [Details] |
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1999 | 'Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers'
Rantamaki, R;Tuomi, T;Zytkiewicz, ZR;Domagala, J;McNally, PJ;Danilewsky, AN (1999) 'Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers'. Journal of Applied Physics, 86 :4298-4303 [Details] |
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1999 | 'Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, electrical data and raman spectroscopy'
Mcnally, PJ;Curley, JW;Bolt, M;Reader, A;Tuomi, T;Rantamaki, R;Danilewsky, AN;DeWolf, I (1999) 'Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, electrical data and raman spectroscopy'. Journal of Materials Science: Materials in Electronics, 10 :351-358 [Details] |
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1998 | 'A comparative study of Pd/Sn/Au, Au/Ge/Au/Ni/Au, Au-Ge/Ni and Ni/Au-Ge/Ni ohmic contacts to n-GaAs'
Islam, MS;McNally, PJ (1998) 'A comparative study of Pd/Sn/Au, Au/Ge/Au/Ni/Au, Au-Ge/Ni and Ni/Au-Ge/Ni ohmic contacts to n-GaAs'. Microelectronic Engineering, 40 :35-42 [Details] |
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1998 | 'An evaluation of liquid phase epitaxial InGaAs/InAs heterostructures for infrared devices using synchrotron x-ray topography'
McNally, PJ;Curley, J;Krier, A;Mao, Y;Richardson, J;Tuomi, T;Taskinen, M;Rantamaki, R;Prieur, E;Danilewsky, A (1998) 'An evaluation of liquid phase epitaxial InGaAs/InAs heterostructures for infrared devices using synchrotron x-ray topography'. Semiconductor Science and Technology, 13 :345-349 [Details] |
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1998 | 'A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior'
Baric, A;McNally, PJ (1998) 'A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior'. IEEE Transactions on Education, 41 :219-223 [Details] |
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1998 | 'Thermally stable Pd/Sn and Pd/Sn/Au ohmic contacts to n-type GaAs'
Islam, MS;McNally, PJ (1998) 'Thermally stable Pd/Sn and Pd/Sn/Au ohmic contacts to n-type GaAs'. Thin Solid Films, 320 :253-259 [Details] |
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1998 | 'Effects of metallization thickness on the thermal and long-term stability of Pd/Sn Ohmic contacts to n-GaAs'
Islam, MS;McNally, PJ (1998) 'Effects of metallization thickness on the thermal and long-term stability of Pd/Sn Ohmic contacts to n-GaAs'. Physica Status Solidi (A) Applied Research, 165 :417-426 [Details] |
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1997 | 'The importance of the Pd to Sn ratio and of annealing cycles on the performance of Pd/Sn ohmic contacts to n-GaAs'
Islam, MS;McNally, PJ;Cameron, DC;Herbert, PAF (1997) 'The importance of the Pd to Sn ratio and of annealing cycles on the performance of Pd/Sn ohmic contacts to n-GaAs'. Thin Solid Films, 292 :264-269 [Details] |
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1996 | 'Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's'
McNally, PJ;Tuomi, T;Herbert, PAF;Baric, A;Ayras, P;Karilahti, M;Lipsanen, H;Tromby, M (1996) 'Synchrotron X-ray topographic analysis of the impact of processing steps on the fabrication of AlGaAs/InGaAs p-HEMT's'. IEEE Transactions on Electron Devices, 43 :1085-1091 [Details] |
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1996 | 'Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs-based power varactor diodes'
McNally, PJ;Herbert, PAF;Tuomi, T;Karilahti, M;Higgins, JA (1996) 'Analysis of the impact of dislocation distribution on the breakdown voltage of GaAs-based power varactor diodes'. Journal of Applied Physics, 79 :8294-8297 [Details] |
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1995 | 'Piezoelectrically-active defects and their impact on the performance of GaAs MESFETs'
McNally, PJ;McCaffrey, JK;Baric, A (1995) 'Piezoelectrically-active defects and their impact on the performance of GaAs MESFETs'. Journal Of Materials Processing Technology, 55 :303-310 [Details] |
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1993 | 'MODELING AND EXPERIMENTAL-ANALYSIS OF THE IMPACT OF PROCESS-INDUCED STRESS ON THE ELECTRICAL PERFORMANCE OF GAAS-MESFETS'
MCNALLY, PJ;ROSENBERG, JJ;JACKSON, TN;RAMIREZ, JC (1993) 'MODELING AND EXPERIMENTAL-ANALYSIS OF THE IMPACT OF PROCESS-INDUCED STRESS ON THE ELECTRICAL PERFORMANCE OF GAAS-MESFETS'. Solid-State Electronics, 36 :1597-1612 [Details] |
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1992 | 'THE USE OF GENERALIZED MODELS TO EXPLAIN THE BEHAVIOR OF OHMIC CONTACTS TO N-TYPE GAAS'
MCNALLY, PJ (1992) 'THE USE OF GENERALIZED MODELS TO EXPLAIN THE BEHAVIOR OF OHMIC CONTACTS TO N-TYPE GAAS'. Solid-State Electronics, 35 :1705-1708 [Details] |
Editorial
Year | Publication | |
---|---|---|
2013 | TECHNIQUES 3D imaging of crystal defects.
McNally, PJ (2013) TECHNIQUES 3D imaging of crystal defects. LONDON: Editorial [Details] |
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2008 | Special Issue: Papers from the 6th International Conference on Materials for Microelectronics and Nanoengineering (MFMN2006).
McNally, P (2008) Special Issue: Papers from the 6th International Conference on Materials for Microelectronics and Nanoengineering (MFMN2006). DORDRECHT: Editorial [DOI] [Details] |
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2008 | Editorial.
McNally P. (2008) Editorial. Editorial [DOI] [Details] |
Enterprise Engagement
Year | Engagement Type | Organisation | Description | |
---|---|---|---|---|
2000-2018 |
Equipment use/Access to Infrastructure | ANKA Synchrotron | X-ray diffraction imaging experimentation | |
2008-2018 |
Equipment use/Access to Infrastructure | Diamond Light Source (UK) | X-ray diffraction imaging experimentation |
Research Interests
External Collaborators
Name | Organisation / Institute | Country | |
---|---|---|---|
Prof. Brian Tanner | Durham University | UNITED KINGDOM | |
Dr Andreas Danilewsky | Freiburg Univesity | GERMANY |
Modules Coordinated
Term (ID)) | Title | Link | Subject | |
---|---|---|---|---|
2019 | Solid State Electr. & Semiconductor Devices | EE463 | Solid State Electr. & Semiconductor Devices | |
2019 | Fundamentals of Nanoelectronics Technology | EE559 | Fundamentals of Nanoelectronics Technology | |
2019 | Description of 2019_EE550 | EE550 | Subject of 2019_EE550 |