The EVOLS15 Scanning Electron Microscope (SEM) is a type of electron microscope that uses electrons to produce greyscale images of a sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. An SEM has higher magnification, higher resolution and greater depth of focus capabilities over conventional microscopes. Compositional analyses of a sample can also be performed on a SEM.

For operational manuals, please click on the links below:

• Leo 440 Software
• 800 Series Stage
• HRRU
• Stereo Scan 440

For service:

• Leica Cambridge Ltd
• Cliffton Road
• Cambridge CB1 3QH
• England

• Telephone: +44 223 411411
• Fax: +44 223 412776
• Website: Leica